| A Theoretical Framework for Standardized Test Methods for Laser System Reliability and Mean Time Between Failure (MTBF) |
| کد مقاله : 1241-NAEC (R1) |
| نویسندگان |
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شهریار ابوالحسینی *1، فاطمه ویسی2، زهره رجبی2 1پژوهشکده فوتونیک و فناوری کوانتومی 2پژوهشگاه علوم و فنون هسته ای |
| چکیده مقاله |
| The absence of standardized methodologies for assessing laser system reliability and reporting Mean Time Between Failure (MTBF) represents a significant challenge in photonics engineering, leading to incomparable data and obscured lifecycle costs. This paper addresses this gap by developing a novel conceptual framework for standardizing laser reliability testing. We synthesize isolated component-level failure models into a cohesive system-level theory and formally define failure thresholds for different laser applications. Our methodology employs conceptual analysis grounded in systems theory, utilizing axiomatic design and synthesizing established reliability models—namely the Weibull distribution and the Cox proportional hazards model—to construct a holistic theoretical network. This network describes the functional relationships between operational stressors and system-level failure rates. Our key theoretical contribution is a generalized model, λeff (I, T), that captures the non-linear impact of key stressors on MTBF and identifies critical degradation pathway interactions. The framework provides a principled foundation for developing transparent and reproducible test protocols. We conclude that this theoretical approach has significant implications for future standardization efforts, design-for-reliability practices, and interdisciplinary research, bridging the gap between reliability theory and practical laser engineering. |
| کلیدواژه ها |
| Laser System Reliability, Mean Time Between Failure (MTBF), Standardized Test Methods, Theoretical Framework, Reliability Modeling, Weibull Analysis, Operational Lifespan Prediction |
| وضعیت: پذیرفته شده |
